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SELECT prs.*, MATCH (headline, description) AGAINST ('Engineer's Office for Applied Spectroscopy,Transpec 2000,Transpec,Nir,Vis,Uv,Pevd,Pvd,Vacuum,Plasma,Sputter,Chamber,Emission Control,Emission,Plasma Control,Plasma Emission,Spectrometry,Spectroscopy,Photometer,Spectrometer,Photodiode Array,Photodiode,Diode Array,Web Coater,Web Coating,Coating,Coater,Layer Control,Layer,White Light,White-light,Reflectometry,Interference,Thin Film Gage,Thin Film Gauge,Thin Film Measurement,Thin Film,Thickness Gage,Thickness Gauge,Thickness Measurement,Film Thickness Gage,Film Thickness Gauge,Film Thickness Monitor,Film Thickness Measurement,Film Thickness') relevance FROM press_release prs WHERE MATCH (headline, description) AGAINST ('Engineer's Office for Applied Spectroscopy,Transpec 2000,Transpec,Nir,Vis,Uv,Pevd,Pvd,Vacuum,Plasma,Sputter,Chamber,Emission Control,Emission,Plasma Control,Plasma Emission,Spectrometry,Spectroscopy,Photometer,Spectrometer,Photodiode Array,Photodiode,Diode Array,Web Coater,Web Coating,Coating,Coater,Layer Control,Layer,White Light,White-light,Reflectometry,Interference,Thin Film Gage,Thin Film Gauge,Thin Film Measurement,Thin Film,Thickness Gage,Thickness Gauge,Thickness Measurement,Film Thickness Gage,Film Thickness Gauge,Film Thickness Monitor,Film Thickness Measurement,Film Thickness') LIMIT 0,5
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